Medical College of Wisconsin
CTSICores SearchResearch InformaticsREDCap

Mesh term Spectrometry, Mass, Secondary Ion

Browse to parent terms:
Mass Spectrometry

Description

A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions.



Search for this term in our Faculty Database



View this term at the NCBI website
jenkins-FCD Prod-321 98992d628744e349846c2f62ac68f241d7e1ea70