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Determination of interfacial roughness correlation in W/C multilayer films: Comparison using soft and hard x-ray diffraction Journal of Applied Physics 1993;74(10):6158-6164

Date

12/01/1993

DOI

10.1063/1.355182

Scopus ID

2-s2.0-0000315635 (requires institutional sign-in at Scopus site)   40 Citations

Author List

Savage DE, Phang YH, Rownd JJ, MacKay JF, Lagally MG

Author

Jason Rownd MS Instructor in the Radiation Oncology department at Medical College of Wisconsin