Mesh term Electron Probe Microanalysis
Browse to parent terms:Microscopy, Electron
Spectrometry, X-Ray Emission
Description
Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.Search for this term in our Faculty Database
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